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Atomic Force Microscopy in Process Engineering

Publisher: Butterworth-Heinemann
Date : 2009-08-26
Pages : 352
Format : pdf
Language : English
ISBN-10 : 1856175170

Atomic force microscopy (AFM) is a surface imaging technique that can be applied at sub-nanometre resolution in liquids and gases. The same instrumentation can also be used to quantify directly the forces of interfacial interaction in such environments and is therefore a critical tool for process engineers and scientists, where AFM investigations are leading directly to improved processes and products.

This is the first book to bring together both the basic theory and proven process engineering practice of AFM, and to present them in a way that is accessible and valuable to both practising engineers, those who are improving their AFM skills and knowledge, and to researchers who are developing new products and solutions using AFM.

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